Keyword search on ‘material characterization’
Equipment Name | Description & Use | Department | Contact |
---|---|---|---|
Fourier Transform Infrared Spectrometer (FT-IR) | Infrared Spectrophotometer, qualitative analysis | Physics and Materials Science | gustav.borstad@memphis.edu |
Thermogravimetric Analysis (TGA) | Thermogravimetric analysis | Physics and Materials Science | gustav.borstad@memphis.edu |
Fluorescence Spectrophotometer | Material characterization, 250 - 850 nm, 0.3 nm resolution | Physics and Materials Science | gustav.borstad@memphis.edu |
Sapphire SF 488-50 CDRH USB Laser System | CW laser for fluorescence and Raman | Physics and Materials Science | tbhoang@memphis.edu |
Flare NX 515-0.6-2 Air Laser System | kHz laser for fluorescence and Raman | Physics and Materials Science | tbhoang@memphis.edu |
Raman Microscope | Raman spectrometer to study the variation modes of the materials | Physics and Materials Science | tbhoang@memphis.edu |
Am scope 50X-1000X Advanced Upright Polarized-light imaging system | Microscope | Physics and Materials Science | cpeng@memphis.edu |
Olympus BX-51 optical microscope | Microscope | Physics and Materials Science | cpeng@memphis.edu |
Amscope 40X-1000X Upright Fluorescence Microscope with Rotating Multi-filter Turret | 40X-1000X Upright Fluorescence Microscope with Rotating Multi-filter Turret | Physics and Materials Science | cpeng@memphis.edu |
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